The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 1993
Filed:
Jun. 03, 1991
Lisa B Maurice, Jericho, VT (US);
James R Parkinson, Vergennes, VT (US);
William B Spillman, Jr, Charlotte, VT (US);
Simmonds Precision Products, Inc., Akron, OH (US);
Abstract
A debris monitor apparatus and method and optical sensor apparatus and method that use the Faraday Effect to detect accumulation of debris on a magnetic probe. The probe contains a magnet and the optical sensor and is immersible in the fluid. As debris accumulates on the probe, the magnetic field changes. The optical sensor includes a magneto-optic material located within a portion of the changeable magnetic field, preferably near a node of the magnet. Means are provided to bi-directionally address the sensor magneto-optic material with linearly polarized light. Means are also provided to convert rotation of the light polarization angle into a modulation of the light's intensity. An electro-optic transducer converts the light intensity into electrical signals that indicate the quantity of debris accumulation on the probe, with a differentiated value of these signals with respect to time yielding rate of debris accumulation on the probe. Means are provided to calculate a ratio defined by the difference over sum of two bi-directionally transmitted pulses to provide a self-referenced output dependent only on the change in magnetic field caused by accumulation of debris on the probe. The changed magnetic field provides an inherent real-time memory of the accumulation of debris on the probe, which also permits multiplexed data collection.