The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 1993

Filed:

Jan. 15, 1992
Applicant:
Inventors:

Calvin M Miller, Atlanta, GA (US);

Jeffrey W Miller, Symrna, GA (US);

Assignee:

Micron Optics, Inc., Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
385 25 ; 385 49 ; 385 52 ; 385 64 ; 385 73 ; 385 75 ;
Abstract

A single wafered optical fiber ferrule assembly useful in fixed and tunable fiber Fabry-Perot (FFP) filters is described. The ferrule assembly contains a wafered ferrule with embedded mirror and a mirrored-end ferrule which are aligned with respect to each other along a longitudinal axis in an alignment fixture. The ferrules are aligned and spaced with respect to each other to maximize transmission of light of a selected wavelength through the filter. The wafered ferrule is composed of a fiber ferrule and a wafer greater than or equal to about 5 .mu.m in thickness which are bonded together with a mirror embedded between the wafer and the ferrule. The ferrule assembly forms a FP optical resonance cavity between the two mirrors. The single wafered ferrule design produces more easily manufactured and more stable FFP than prior art designs.


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