The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 1993

Filed:

Feb. 03, 1992
Applicant:
Inventors:

Harold W Tomlinson, Jr, Scotia, NY (US);

Jerome J Tiemann, Schenectady, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
367-7 ; 367 11 ;
Abstract

Coherent light is projected through a scattering medium. The light emerging from the medium is a superposition of a multitude of scattered wavelets, each of which represents a specific scattering path. These wavelets are projected onto a diffuse reflecting surface (the viewing plane of a two-dimensional photodetector array) where they interfere with each other, giving rise to a speckle pattern. By introducing a focused ultrasound pulse into the medium, the position of the scatterers are changed at a known location (probe region) in the medium, and this causes a change in the speckle pattern. By comparing speckle images before and after the scatterers are moved, the light absorption properties of the probe region can be measured even though multiple scattering interferes with direct imaging of the region.


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