The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 1993

Filed:

Feb. 13, 1991
Applicant:
Inventor:

Forrest C Meyer, Eden Prairie, MN (US);

Assignee:

Seagate Technology, Inc., Scotts Valley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G04F / ; G11B / ; G11B / ;
U.S. Cl.
CPC ...
324212 ; 3281291 ; 360 51 ;
Abstract

A flaw identification circuit receives digitized read data and provides an error output representative of defects in a magnetic storage medium. A uniform data pattern is written on the magnetic storage medium. The flaw identification circuitry uses a precision delay circuit and a linear ramp circuit. The linear ramp circuit generates a linear ramp using the charging of a capacitor with a constant current source. This provides an accurate time base reference. The output of the linear ramp circuit is applied to a flash analog-to-digital converter. The flash analog-to-digital converter is directly triggered by the digitized read data signal. The output of the flash analog-to-digital converter is applied to a maximum comparator and a minimum comparator. If the output value of the analog-to-digital converter falls outside of the maximum and minimum value range, an error is signalled. The error is representative of shifts in the location of edges of data pulses in the digitized read data signal. This corresponds to a defect in the magnetic storage medium.


Find Patent Forward Citations

Loading…