The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 1993
Filed:
Aug. 06, 1992
Applicant:
Inventors:
Assignee:
Horiba, Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250573 ; 250574 ; 356336 ; 356338 ; 356340 ;
Abstract
A sample cell for use in measuring the particle size distribution of samples using diffraction-scattering measurement methods has a radiating surface which is beveled to increase the angle of incidence of scattered light which is scattered at a large scattering angle such that it is transmitted through the radiating surface of the sample cell and thereby allowed to impinge upon a detector.
Togawa, Yoshiaki. (1993). Sample cell for diffraction-scattering measurement of particle size (U.S. Patent No. 5212393). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5212393
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile