The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 1993
Filed:
Nov. 19, 1990
Bernard C DeWitt, Austin, TX (US);
Michael G Gallup, Austin, TX (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
A data processing system uses a scannable test circuit to provide transistor fault testing of a large amount of random transistor logic. In a test mode of operation, a plurality of Master-Slave latches are used to observe the output of a plurality of data path drivers activated during a scan test operation. The data path drivers are included as part of the random transistor logic, and the outputs of the data path drivers are connected to a set input of the Master portion of one of a plurality of Master-Slave latches. The Master-Slave latches can be scanned to provide a test signal providing transistor fault information in the data processing system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile