The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1993

Filed:

May. 21, 1990
Applicant:
Inventors:

Yen F Cheu, Rochester Hills, MI (US);

August F Scarpelli, Warren, MI (US);

Assignee:

General Motors Corporation, Detroit, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
36441319 ; 36441314 ; 3644132 ; 36441321 ; 378 19 ; 378 62 ; 378901 ; 382 42 ; 382 54 ;
Abstract

Tomography apparatus is used to irradiate a body cross section and acquire a relatively small amount of data which is mapped into a two dimensional array or sinogram and image enhancement techniques are applied to the sinogram to reveal visible lines representing flaws. An array processor operates on the sinogram to perform edge enhancement and averaging convolutions, a fast Fourier transform, low pass filtering in frequency domain, and an inverse fast Fourier transform to generate the enhanced sinogram.


Find Patent Forward Citations

Cheu, Yen. (1993). Sinography method and apparatus (U.S. Patent No. 5210688). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5210688

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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