The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 1993
Filed:
Sep. 19, 1991
Applicant:
Inventors:
Nicolas J Harrick, Ossining, NY (US);
Milan Milosevic, Fishkill, NY (US);
Assignee:
Harrick Scientific Corp., Ossining, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
250339 ; 250341 ; 356244 ; 356300 ;
Abstract
An ultra-small sample analyzer for internal reflection spectrometry comprises a small hemispherical crystal of an infrared-transparent hard material whose flat surface receives the sample to be analyzed. The analyzing beam is contracted to a very small size when incident on the hemispherical surface. Pressure-applying means of a size substantially matching that of the beam at the sampling surface enables interaction of substantially the entire beam with the sample producing spectra of high contrast from microgram or nanogram quantities of the sample.