The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 1993
Filed:
Jul. 16, 1991
Applicant:
Inventor:
Tudor N Buican, Albuquerque, NM (US);
Assignee:
The Regents of the University of California, Alameda, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356346 ; 356351 ;
Abstract
Apparatus and method for measuring intensities at a plurality of wavelengths and lifetimes. A source of multiple-wavelength electromagnetic radiation is passed through a first interferometer modulated at a first frequency, the output thereof being directed into a sample to be investigated. The light emitted from the sample as a result of the interaction thereof with the excitation radiation is directed into a second interferometer modulated at a second frequency, and the output detected and analyzed. In this manner excitation, emission, and lifetime information may be obtained for a multiplicity of fluorochomes in the sample.