The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 1993
Filed:
Jul. 18, 1991
Charles E Campbell, Berkeley, CA (US);
Allergan Humphrey, San Leandro, CA (US);
Abstract
Badal optics are disclosed in which an aperture array at an optical system under test is interrogated for the deflection of light between a detector array conjugate with the aperture array of the optical system under test being examined. Excursion is measured in a plane normal to the axis of the Badal optics instead of observing towards and away image focus along the axis of the Badal system. In the case of an objective refractor, the eye is illuminated at the retina with a test spot, preferably light in the infrared. An image of a detector array is relayed by a relay lens through the Badal optics to the cornea of the eye, the lens under test. Light emanating from the test spot on the retina passes through the eye lens at the at the image of the detector array. This light undergoes excursion in accordance with the power of eye lens under test at each aperture of the detector array. The extent of this excursion is determined by a moving boundary locus between the image of the detector array and the detector array itself. This excursion is related directly to the eye prescription.