The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 1993
Filed:
May. 21, 1990
Fareed Kureshy, Westwood, MA (US);
Shailendra Singh, Sharon, MA (US);
Gary L Webber, Sharon, MA (US);
PB Diagnostic Systems Inc., Westwood, MA (US);
Abstract
A temperature controlled chamber for an analytical instrument which includes a circular conveyor for transporting assay cartridges, the chamber enclosing the outer peripheral part of the conveyor on which the assay cartridges reside. The temperature controlled chamber has a bottom wall of polymeric material located beneath the conveyor, an outer wall of polymeric material extending upward above the conveyor, a metallic top wall and a metallic inner wall which extends downward to the upper surface of the conveyor. Thermal control, including rapid thermal response to compensate for temperature perturbations induced by periodic introduction of assay cartridges which are at a temperature less than that of the chamber, is accomplished by heating elements located above and below the conveyor. The heating elements are pulsed by an electrical circuit at a rate substantially faster than the rate of introduction of new assay cartridges. Pulses of electric current applied to the heating elements are modulated with pulse-width modulation to adjust the temperature within the chamber in response to signals emitted by a temperature sensor located within the chamber.