The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 1993
Filed:
Sep. 24, 1992
Robert J Gehrke, Idaho Falls, ID (US);
Marie H Putnam, Idaho Falls, ID (US);
E Wayne Killian, Idaho Falls, ID (US);
Richard G Helmer, Idaho Falls, ID (US);
Ronnie L Kynaston, Blackfoot, ID (US);
Scott G Goodwin, Idaho Falls, ID (US);
Larry O Johnson, Pocatello, ID (US);
EG&G Idaho, Inc., Idaho Falls, ID (US);
Abstract
A spectroscopic method to rapidly measure the presence of plutonium in soils, filters, smears, and glass waste forms by measuring the uranium L-shell x-ray emissions associated with the decay of plutonium. In addition, the technique can simultaneously acquire spectra of samples and automatically analyze them for the amount of americium and .gamma.-ray emitting activation and fission products present. The samples are counted with a large area, thin-window, n-type germanium spectrometer which is equally efficient for the detection of low-energy x-rays (10-2000 keV), as well as high-energy .gamma. rays (>1 MeV). A 8192- or 16,384 channel analyzer is used to acquire the entire photon spectrum at one time. A dual-energy, time-tagged pulser, that is injected into the test input of the preamplifier to monitor the energy scale, and detector resolution. The L x-ray portion of each spectrum is analyzed by a linear-least-squares spectral fitting technique. The .gamma.-ray portion of each spectrum is analyzed by a standard Ge .gamma.-ray analysis program. This method can be applied to any analysis involving x- and .gamma.-ray analysis in one spectrum and is especially useful when interferences in the x-ray region can be identified from the .gamma.-ray analysis and accommodated during the x-ray analysis.