The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 1993
Filed:
Apr. 05, 1990
Toshiyuki Tanaka, Yamatokoriyama, JP;
Shigeki Kuga, Nara, JP;
Nobuo Nakamura, Yamatokoriyama, JP;
Taro Morishita, Soraku, JP;
Masahiro Wada, Nara, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
An element checking system for use in forward inference system is disclosed. When checking elements, each element is read out as a token and transmitted through a checking network. The element checking system includes memory for storing an element checking network. The network has a plurality of inputs for receiving the tokens one at a time, and a plurality of nodes for checking features of the received token. The system also includes working memory for storing elements, each element carrying data identifying a particular node from which the checking procedure in the networks starts. An additional memory is included which stores a pattern table including a plurality of different patterns with a pattern number assigned to each pattern, and a linking table including a pattern number and a corresponding node number for designating a starting node number for an element having a corresponding one of the plurality of patterns. Through the use of the pattern and linking table, an efficient element checking system utilizing a minimum number of nodes can be achieved.