The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 1993

Filed:

Dec. 14, 1990
Applicant:
Inventors:

Toshiaki Tamegai, Tokyo, JP;

Kazuyuki Tamura, Tokyo, JP;

Shigeo Kimura, Tokyo, JP;

Koichi Kawamura, Tokyo, JP;

Shizuo Ninomiya, Tokyo, JP;

Assignee:

Aloka Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 53 ; 378 54 ; 378156 ; 378158 ; 378 99 ;
Abstract

A bone mineral content measuring apparatus for obtaining the bone mineral content of an object to be examined by irradiating X-rays onto the object and measuring the X-rays which have passed through the object. An X-ray generating device generates X-rays having a continuous spectrum. The X-rays generated pass through an X-ray filter before the irradiation of the object or after the transmission of the object. The X-ray filter is composed of a substance having an X-ray absorbing characteristic with the K-absorption edge at a predetermined energy value. The X-rays which have passed through the X-ray filter and the object are detected by the X-ray detector. A data analyzer inputs the detected X-ray detection data and analyzes the bone mineral content of the object on the basis of the X-ray absorbing characteristic of the X-ray filter.


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