The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 1993

Filed:

Jan. 13, 1991
Applicant:
Inventors:

Stephen A Jove, Watsonville, CA (US);

Charles R Nielsen, San Jose, CA (US);

Calvin S Nomura, San Jose, CA (US);

Michael L Workman, Rochester, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ; G11B / ;
U.S. Cl.
CPC ...
360 67 ; 360113 ;
Abstract

A circuit for concurrently producing low noise electrical output signals which are amplified representations of signals produced by a magnetoresistive (MR) element and protecting said element from electrical short circuits which can occur between said element and its environment. A first feedback loop comprises (a) an input amplifier for amplifying a signal current from the MR element and (b) a source of bias current for biasing the MR element with a bias voltage. An input amplifier is concurrently biased by said current and amplifies a signal current from the MR element for producing a circuit output signal corresponding to dRh/RhRh and in which any differential direct current (dc) output offset error is minimized. (RhRh is the square of the time-averaged resistance of the MR element and dRh is the magnetic-signal-induced change in the resistance of the MR element.) A second feedback loop, electrically in series with the first feedback loop, biases the MR element toward a preselected reference potential and concurrently prevents flow of a current sufficient to damage the MR element in the event of a short circuit occurring between the MR element and its environment (e.g. the recording surface of a magnetic recording disk).


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