The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 1993
Filed:
Jul. 01, 1992
Applicant:
Inventors:
Peter R Franchi, Winchester, MA (US);
Harvey E Tobin, Brookline, MA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01Q / ;
U.S. Cl.
CPC ...
342360 ;
Abstract
In order to measure the far field antenna pattern of a phased array antenna, the phased array is focused at a probe antenna which is a specific distance away from the aperture. The antenna pattern is then measured by moving the probe antenna on a constant focal arc. This arc minimizes phase aberrations due to defocusing error. To minimize amplitude errors, the pattern of the probe antenna is carefully matched to compensate for the variation induced amplitude error.