The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 1993
Filed:
Feb. 28, 1991
Tadashi Ichihashi, Tokyo, JP;
Takashi Hirano, Shiki, JP;
Kowa Company Ltd., , JP;
Abstract
An ophthalmological measurement apparatus wherein the interior of a patient's eye is irradiated with a laser beam and the scattering of the laser beam is measured to determine protein concentration in the oculi anterior. The apparatus is provided with scanning means for scanning the measurement zone during alignment of the eye as well as during measurement. During alignment the measurement zone is scanned at high speed by the laser beam and at the same scanning width as the scanning width used during measurement, and the signal obtained from the photosensor at this time is processed to provide information on and an indication of the appropriateness of the state of alignment. This makes it possible to observe any harmful light rays that will actually appear during measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile