The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 1993

Filed:

Jun. 03, 1991
Applicant:
Inventors:

Robert L Schaaf, Vestal, NY (US);

Floyd W Olsen, Athens, PA (US);

Edward J Tasillo, Newark Valley, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324537 ; 3241 / ; 324678 ;
Abstract

Capacitance is measured using a system including a high voltage ramp monitor. A signal net is connected to ground by probes while a constant charging current is applied to the internal planes. A pure capacitive net will have a linear voltage rise proportional to capacitance, therefore its capacitance can be represented by ramp time. Leakage shorts will be detected by residual charge current measurements. The stimulus voltage is maintained for a fixed time after ramping to provide net to internal plane stress testing. Measured net capacitance is compared to nominal net capacitance for short/open detection.


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