The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 1993
Filed:
Oct. 17, 1991
Applicant:
Inventors:
Victoria E Granstaff, Albuquerque, NM (US);
Stephen J Martin, Albuquerque, NM (US);
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 5441 ; 73 3 / ; 73579 ;
Abstract
A method, using a quartz crystal microbalance, to obtain simultaneous measurement of solid mass accumulation and changes in liquid density-viscosity product. The simultaneous real-time measurements of electrical parameters yields that changes in surface mass can be differentiated from changes in solution properties. Two methods to obtain the admittance/frequency data are employed.
Granstaff, Victoria. (1993). Method for simultaneous measurement of mass loading and fluid property (U.S. Patent No. 5201215). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5201215
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile