The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 1993

Filed:

Jul. 23, 1990
Applicant:
Inventors:

Steven J Goldberg, Coral Springs, FL (US);

Venkat Narayanan, Boca Raton, FL (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B / ;
U.S. Cl.
CPC ...
455 512 ; 455 381 ; 455 571 ; 455 671 ; 34082544 ;
Abstract

A method for measuring a time delay between a controller (302) and a plurality of base sites (306) in a simulcast system (300). The method begins with the controller (302) transmitting a synchronization signal to a selected base site (306A) and to a delay measurement device (316). Upon receipt of the synchronization signal by the selected base site (306A), the selected base site (306A) transmits a signal to the delay measurement device (316). The delay measurement device (316) determines the time between the receptions of the synchronization signal transmitted by the controller and the signal transmitted by selected base site (306A). The delay measurement device (316) transmits the delay time determined between the receptions of the synchronization signal transmitted by the controller and the signal transmitted by the selected base sites (306A) to the controller (302) which programs the base sites (306) to delay transmissions of the RF signals in response to the measured delay time.


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