The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 1993

Filed:

Jun. 05, 1991
Applicant:
Inventors:

Atushi Hisano, Nagaokakyo, JP;

Hiroshi Teramoto, Jyoyo, JP;

Atushi Mizoguchi, Hikone, JP;

Hiroshi Hisada, Moriyama, JP;

Siro Fujieda, Otokuni, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 50 ; 382 51 ; 358466 ;
Abstract

This invention relates to an image binarization threshold computing apparatus comprising a window scanning means for setting a window of predetermined area over a multilevel image and scanning the same image, a first information generating means for generating a first data on brightness of the image within the window, a second information generating means for generating a second data on fitness of the image within the window with respect to a preset pattern, a third information generating means for generating a third data serving as a picture quality assessment criterion from the first and second data, and an optimal threshold computing means for calculating the optimal threshold value providing the best picture quality according to the third data.


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