The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 1993

Filed:

May. 21, 1990
Applicant:
Inventors:

Yasuki Ishikawa, Kanagawa, JP;

Yasuhiro Shiraishi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364578 ; 36442405 ;
Abstract

A system for detecting failure in a system controlling an inductance load is provided. This system comprises a controller for providing a driving signal to the inductance load to control it, a dither signal generator for adding a dither signal to the driving signal to be provided to the inductance load, a first monitor for monitoring the dither signal included in the driving signal provided by the controller to detect failure in the controller by detecting an absence of the dither signal therein, and a second monitor for monitoring variation in level of the driving signal from the controller to deactivate failure detecting operation of the first monitor in response to variation above a preselected level to prevent the system from mistakenly interpeting transient level fluctuations as a system failure.


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