The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 1993
Filed:
Jul. 29, 1991
Deutsche Forschungsanstalt fur Luft- und Raumfahrt e.v., Cologne, DE;
Abstract
An optical interferometer used for measuring the rotational angle or the anglular position of a rotating object, in which a path deflection is caused by means of the rotation of a reflector, the rotational movement of which is coupled with that of the object to be measured and thus is synchronous with its rotation. Furthermore, a laser beam is introduced into the interferometer. The path deflection caused by the rotation of the retro-reflector creates in the introduced laser beam varying interferences of defined wave length, which are proportional to the rotational angle of the reflector and of the object to be measured which drives it. Furthermore, the angular resolution is inversely proportional to the wave length of the laser beam.