The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 1993

Filed:

Aug. 13, 1992
Applicant:
Inventors:

John B Hayes, Tucson, AZ (US);

Jamshid Jahanmir, Tucson, AZ (US);

Eric M Frey, Tucson, AZ (US);

Assignee:

Wyko Corporation, Tucson, AZ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250306 ; 250310 ; 250311 ;
Abstract

A scanning probe microscope includes a base, an inner piezoelectric tube, and an outer PMN translator arrangement including three PMN posts, with first ends of the PMN posts connected to the base. A first end of the inner piezoelectric tube is rigidly connected to second ends of the PMN posts. Inner quadrant conductors are disposed on the inner surfaces of the inner piezoelectric tube, and outer quadrant conductors are disposed on the outer surfaces of the inner piezoelectric tube. Separate x and y scan control voltage signals are applied to corresponding opposed quadrant conductors of the inner piezoelectric tube to control scanning of the free end of the inner tube in the x and y directions. A z scan control voltage is produced by a servo control circuit in response to a probe signal and applied to the PMN posts, which have negligible hysteresis. The servo control circuit refers to a look-up table to correct non-linearities of the PMN posts.


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