The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 1993
Filed:
Dec. 19, 1991
Applicant:
Inventors:
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250306 ; 25044111 ;
Abstract
An environment controllable scanning probe microscope (SPM), such as a scanning tunneling microscope (STM), atomic force microscope (AFM), etc., in which the gaseous environment of the sample during the observation is controllable. That is, the gas surrounding the sample can be replaced to a desired one and the pressure can be set to a desired value. The SPM is suited for observing biological samples because biological samples may deteriorate under a reduced pressure and the surface topography at such high magnification is vulnerable to contamination from the environment.