The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 1993

Filed:

Oct. 21, 1991
Applicant:
Inventors:

Sheldon M Smith, Los Gatos, CA (US);

Clement C Hiel, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73851 ; 7315 / ; 73827 ;
Abstract

A method and apparatus are provided for determining the strain developed in a coated surface. A beam with a coating on a surface thereof is mounted as a cantilever and a force is applied to the free end of the beam to cause deflection of the beam until the coating on the beam fails. The strain in the beam, and hence in the coating at the point of failure, is determined based on the dimensions of the beam, the point along the beam where failure of the coating occurs and the amount of deflection of the beam, and this determination is made independently of the temperature of the beam and the material from which the beam is made. The determination is made based on the equation E=1.5.sub.x /1.sup.3, where E is strain, h is the beam thickness, d is the beam deflection, x is the distance from the free end of the beam to the point where failure of the coating occurred, and l is the length of the beam.


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