The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 1993
Filed:
May. 07, 1991
Charles Campbell, Berkeley, CA (US);
Allergan Humphrey, San Leandro, CA (US);
Abstract
Adaptions of lensmeter optical trains are disclosed for enabling the measurement of contact lenses without the interference of spherical aberration from the highly meniscus lens formats of contact lenses. A generic system of measurement of the contact lenses when off of the eye is introduced by having light incident to or passing from the suspect contact lenses at an approximate aplanatic condition of the contact lens. The approximate aplanatic condition is determined by taking the average power of the posterior and anterior surfaces of the contact lenses for the general population--approximately 8 mm, assuming an index of refraction of approximately 1.5--calculating the aplanatic condition for such a 'surface,' and having light incident on the lenses for the interrogation of the lenses approximate the aplanatic condition. Modification of four optical trains for contact lens measurement is disclosed, including a Badal type optical train, a typical focusing lensmeter, an automated lensmeter utilizing mask pattern with photodetector array, and a lens system with a matrix of light focusing lenses.