The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 1993

Filed:

Feb. 12, 1991
Applicant:
Inventors:

Noboru Masuda, Kawaguchi, JP;

Tetsuo Oosawa, Tokyo, JP;

Yasutaka Fujii, Sagamihara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324671 ; 324672 ; 324675 ; 324682 ;
Abstract

Apparatus for detecting thickness which includes an electrode detecting unit including a ground electrode and a detecting electrode. The electrodes oppose each other along a paper path. An oscillating circuit provides an oscillation frequency signal. A resonant circuit, having a resonator independent of the oscillating circuit, has a resonance point which changes in accordance with a change in electro-static capacitance corresponding to a change in paper thickness detected by the electrode detecting unit. A resonant circuit outputs a detection signal corresponding to the change in resonance point. By analyzing this detecting signal, a state of two sheets of paper passing through the path is detected as a change in paper thickness.


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