The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 1993
Filed:
Jan. 21, 1992
Applicant:
Inventors:
Gordon E Hines, Ann Arbor, MI (US);
Myles K Jakubowski, Baxter, TN (US);
Patrick D Hill, Belleville, MI (US);
Assignee:
Hines Industries, Inc., Ann Arbor, MI (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B67D / ;
U.S. Cl.
CPC ...
222 14 ; 222 52 ; 222 71 ; 222181 ; 222639 ; 83370 ; 264142 ; 264148 ;
Abstract
A material metering apparatus is disclosed which extrudes highly viscous material from an orifice of a known diameter past two fiber optic sensors to initiate and terminate a timing sequence. Knowing the specific gravity of the material, the apparatus uses the timing sequence and known diameter of the orifice to calculate the weight of the material so extruded. The components of the material metering apparatus are removable to facilitate ease of cleaning the variation in the viscous material subject to extrusion.