The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 1993

Filed:

Oct. 10, 1991
Applicant:
Inventors:

Peter J Klopotek, Framingham, MA (US);

Alex C Sacharoff, Framingham, MA (US);

Richard G Caro, Boston, MA (US);

Assignee:

Summit Technology, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61H / ;
U.S. Cl.
CPC ...
606 12 ; 606-2 ; 606-4 ; 606 10 ; 128897 ; 128898 ;
Abstract

Methods and apparatus for determining the depth of excision generated by a material removal process, for determining the thickness of unablated material below the excision or incision, and for providing endpoint control of a material removal process utilize acoustic transducers for measuring the time delay between a first acoustic pulse resulting from material removal and a second acoustic pulse reflected from a distal surface or boundary layer of the material. The time delay between the two pulses detected by the transducer provides a measure of excision depth and of the depth of material below the excision. Endpoint control is provided by terminating material removal when a selected excision depth is detected. The invention can be used, for example, as a real-time monitor of excision depth and residual lamella thickness under the excision during laser corneal surgery.


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