The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1993
Filed:
Jul. 28, 1992
Koji Fushimi, Gifu, JP;
Keiji Kawasaki, Nagoya, JP;
NGK Insulators, Ltd., Nagoya, JP;
Abstract
An ultrasonic testing method for detecting flaws of balls for structural members comprises rotating a ball to be tested in an ultrasonic wave transmitting medium. At least two focus-type ultrasonic probes are provided and arranged so as to cover nonoverlapping flaw-detecting regions on and/or inside the ball. Flaws in the ball are detected by sending ultrasonic waves from the probes toward the ball. An apparatus for detecting flaws of balls comprises a ball holding portion for rotatably holding the ball to be tested, at least two focus-type probes for detecting flaws and at least two probe mounting portions for mounting the probes thereof so that respective axes of the probes are each capable of being set eccentrically relative to the center of the ball and wherein the focal positions of the probes are variable.