The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 1993

Filed:

Aug. 18, 1992
Applicant:
Inventors:

Hiroshi Takino, Ibaraki, JP;

Makoto Komai, Ibaraki, JP;

Noriyuki Isobe, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73-9 ; 73146 ; 374 45 ;
Abstract

Method for measuring resistance to slippage comprising the steps of mounting a sample of rubber at the bottom of a pendulum freely swinging on a shaft, sliding the sample of rubber along a road surface sample which is either dry or wet during swinging of the pendulum, measuring kinetic energy loss of the pendulum due to sliding of the sample thus obtaining resistance to slippage, in combination with the step of either heating or cooling the sample of rubber to a predetermined temperature for performing the method.


Find Patent Forward Citations

Takino, Hiroshi. (1993). Method for measuring resistance to slippage (U.S. Patent No. 5195357). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5195357

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…