The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1993
Filed:
Apr. 17, 1992
Lalit R Bahl, Amawalk, NY (US);
Peter V De Souza, Yorktown Heights, NY (US);
Ponani S Gopalakrishnan, Croton-on-Hudson, NY (US);
David Nahamoo, White Plains, NY (US);
Michael A Picheny, White Plains, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Symbol feature values and contextual feature values of each event in a training set of events are measured. At least two pairs of complementary subsets of observed events are selected. In each pair of complementary subsets of observed events, one subset has contextual features with values in a set C.sub.n, and the other set has contextual features with values in a set C.sub.n, were the sets in C.sub.n and C.sub.n are complementary sets of contextual feature values. For each subset of observed events, the similarity values of the symbol features of the observed events in the subsets are calculated. For each pair of complementary sets of observed events, a 'goodness of fit' is the sum of the symbol feature value similarity of the subsets. The sets of contextual feature values associated with the subsets of observed events having the best 'goodness of fit' are identified and form context-dependent bases for grouping the observed events into two output sets.