The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1993
Filed:
Jan. 22, 1992
Christian M Le Floc'h, Blanquefort, FR;
Pierre Sarrazin, Bordeaux, FR;
Daniel M Babot, Villeurbanne, FR;
Gilles G Peix, Villeurbanne, FR;
Abstract
A method and a system for enabling high accuracy measurements to be obtained of the location of a plane separating two media of different densities by using the Compton effect, and application thereof to measuring the thicknesses of layers. A measurement assembly constituted by a transmitter and a receiver of X-rays or gamma rays which are focused in emission and in reception irradiates an elementary volume of said media, and is displaced perpendicularly to the plane between said media, and a fifth signal is calculated representative of the extent by which the derivative of the detected signal relative to the displacement exceeds a threshold, after which the barycenter of displacements corresponding to the most recent sequence of said same-sign fifth signals is calculated, with the displacements being weighted by the corresponding one of said fifth signals.