The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1993
Filed:
Jul. 07, 1992
Applicant:
Inventors:
Osamu Ueda, Hyogo, JP;
Tsuyoshi Toyama, Hyogo, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M / ;
U.S. Cl.
CPC ...
371 404 ; 371 401 ; 371 211 ; 365200 ;
Abstract
A semiconductor memory device having an error correcting circuit includes a circuit for generating a desired test signal with which memory cells used for error correction are to be tested, and another circuit for judging on an chip-basis whether memory cells of the semiconductor memory device are normal or not. The memory cells for error correction can be tested accurately by application of desired test signal. In addition, since there is no necessity of provision of a circuit for comparing externally applied data and data delivered from the semiconductor memory device, a test can be preformed readily.