The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 1993
Filed:
Mar. 09, 1992
Applicant:
Inventor:
Matthew P Moore, Bellevue, WA (US);
Assignee:
John Fluke Mfg. Co., Inc., Everett, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
371 211 ; 371 511 ; 371 251 ;
Abstract
A method of functionally testing cache tag RAMs in processor systems where the kernel is typically inaccessible. A test program first determines whether a fault exists at all within the cache tag RAM. If a fault is determined to exist, the faulty RAM location is exercised by sequentially applying patterns of ones and zeros until the pattern of bits actually present at the faulty tag RAM location is determined. A comparison of this pattern of bits with the expected bit pattern provides information as the precise location of the fault so as to permit replacement of defective chips.