The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 1993

Filed:

Dec. 19, 1991
Applicant:
Inventor:

Hideki Asada, Tokyo, JP;

Assignee:

GTC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G / ; H03K / ;
U.S. Cl.
CPC ...
340784 ; 340719 ; 340789 ; 307481 ;
Abstract

A scanning circuit for successively scanning a plural number of capacitive loads comprising: a delay circuit 101 for delaying a supplied pulse signal from a previous stage in accordance with a first clock signal; a switching transistor 102 which is controlled by the first clock signal; an EXNOR circuit 103 which judges whether or not the signal generated by the delay circuit 101 is correct; a non-inverting buffer circuit 104 for reserve of the delay circuit 101; switching transistors 105 and 106 which are controlled in accordance with the signal generated by the EXNOR circuit 103; and an output buffer circuit 107 which is controlled in accordance with the first clock signal or a second clock signal. Accordingly, the scanning circuit can operate correctly even if one of the delay circuit 101 or the non-inverting buffer circuit 104 fails.


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