The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 1993
Filed:
Oct. 10, 1990
Applicant:
Inventor:
Masaru Takeda, Saitama, JP;
Assignee:
Fuji Xerox Co., Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395158 ; 395157 ; 395155 ; 340717 ; 340750 ;
Abstract
A multiwindow control system in which, if an examination window overlaps a display area of a detecting window and has the same parent as the detecting window, the system divides the display area of the detecting window by an extension of the overlapping side of the examination window and changes the divided display areas into new detecting areas. After the portions of detecting areas which overlap with individual examination windows are successively divided, the remaining new detecting areas become areas of the original detecting window in which image information can be displayed.