The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 1993
Filed:
Sep. 08, 1989
Steven M Pincus, Guilford, CT (US);
Robert A Neidorff, Bedford, NH (US);
Other;
Abstract
An approximation of entropy is determined on a set of data by comparing subsets of the data. The comparison reveals the regularity and stability of similar patterns amongst subsets of the data. The comparisons perform such that the contribution of noise to measurement of the regularity and stability is minimized. Quantitative values are assigned to measure the degree of regularity and stability. From these quantitative values a single output measure is generated indicative of the amount of patternness of the sequence of data. The calculations required to determine this approximate entropy are preferably performed within a data processing system. Numerous peripheral devices may be attached to such a data processing system. The types of data for which the approximate entropy may be calculated include any sets of data wherein the amount of patternness is sought.