The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 1993
Filed:
Dec. 07, 1990
Alward I Pinard, Westford, MA (US);
Intergraph Corporation, Huntsville, AL (US);
Abstract
A scanning system, having a fixed platen and optical imaging system and a translated reference scale, is provided for scanning of a modulated light beam (or a set of parallel, independently modulated light beams) onto an object surface. The optical system provides a combined light beam including the modulated light beam and a reference light beam. An optical imaging device moves the combined light beam along a scan line, and a translatably mounted beam splitter splits the combined light beam to direct at least some of the reference light beam onto a reference scale and a sensor. The reference scale sensor, which is rigidly attached to the beam splitter, and is responsive to reference beam position in two directions, provides a clocking signal indicative of beam position along the scan line and a vernier position signal indicative of beam position in a direction transverse to the scan line. An optical stepper controls the translation of the beam splitter such as to position precisely each of a series of scans in a direction transverse to the scan lines.