The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 1993

Filed:

Mar. 05, 1992
Applicant:
Inventors:

Shein S Wang, Ponca City, OK (US);

David W Bell, Ponca City, OK (US);

Assignee:

Conoco Inc., Ponca City, OK (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
367 38 ; 367 53 ; 367 73 ;
Abstract

The invention relates to a method for locating correct near vertical boundary or fault positions in a velocity model using common reflection point (CRP) gathers. Conventional migration velocity analysis examines the migrated image for hints to correct the velocity model. Vertical boundaries such as faults or salt flanks must be accurately determined to produce reliable images of deeper reflectors. Previous methods have placed faults by trial and error, since a depth image of a nearly vertical boundary is difficult to produce. The present method examines the sensitivity of CRP gathers to abrupt lateral changes across a nearly vertical fault to determine the location and the dip of a nearly vertical fault from a series of CRP gathers.


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