The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 1993
Filed:
Jan. 28, 1991
Hiroshi Sugimoto, Nasu, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A method and an apparatus of setting multi-slice imaging conditions in computed tomographic imaging systems capable of taking a desired multi-slice imaging in a desired imaging region without scanning imaging. In the method and apparatus, an object to be imaged is illuminated along at least one projection plane and within at least one projection area corresponding to an imaging region; the projection area is changed and detected; one of the multi-slice imaging conditions including an imaging time interval, a slice thickness, and a number of slices is specified; and a remaining part of the multi-slice imaging conditions is determined in accordance with the part of the multi-slice imaging conditions specified by the specifying means and the detected projection area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile