The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 1993

Filed:

Jul. 30, 1990
Applicant:
Inventors:

Raymond A Birgenheier, Spokane, WA (US);

Richard P Ryan, Spokane, WA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B / ; H04B / ;
U.S. Cl.
CPC ...
375 10 ; 375 39 ; 375 42 ; 375 94 ; 375 96 ; 375118 ; 455 671 ; 455115 ; 455226 ; 332150 ;
Abstract

A method and apparatus for determining the phase and amplitude accuracy of continuous-phase-modulated signals is described. A modulated RF signal generated by a transmitter is down converted to a relatively low intermediate frequency which is filtered and sampled by a high sampling rate analog-to-digital converter. A digital signal processor processes the digital signals to produce a measured phase function corresponding to the modulated RF signal. From the measured amplitude and phase functions, an estimate of the ideal reference phase function corresponding to the modulated RF signal is calculated and synthesized. The reference phase function is compared to the measured phase function to determine the phase function from which the modulated RF signal phase error and frequency error are computed.


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