The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 1993

Filed:

Sep. 11, 1991
Applicant:
Inventor:

Hajime Yoshida, Tokyo, JP;

Assignee:

Hajime Industries, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358106 ; 2502 / ; 358101 ;
Abstract

An image of the inspected object, irradiated by a light, is picked by a video camera and a video signal therefrom is processed by an electronic processor. A pattern judging window is setup on the inspected object to thereby judge whether a pattern exists on the object, and when it is judged that there is no pattern a plurality of inspection windows are set up to thereby perform a predetermined defect inspection on portions of the inspected object within the plurality of windows. A pattern discrimination window is setup on the inspected object when it is judged that there exists a pattern so as to discriminate the kind of pattern, and either setting up the inspection window or another inspection window depending on the kind of pattern so discriminated.


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