The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 1993

Filed:

Jun. 10, 1991
Applicant:
Inventors:

Thomas J Wagener, Eden Prairie, MN (US);

Paul E Bjork, Forrest Lake, MN (US);

James E Lenz, Brooklyn Park, MN (US);

Assignee:

Honeywell Inc., Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
34087032 ; 32420711 ; 32420713 ;
Abstract

A position sensor is provided which incorporates the first and second magnetic members which are attached to an object whose position is to be determined. First and second magnetic sensors are disposed at positions in association with the two magnetic members. As the object moves along a predetermined path, the first and second magnetic members dispose a predetermined amount of magnetic material in the zones of the two sensors. By measuring the changing impedance of the winding of one of the sensors and comparing that value to the impedance of the winding of the other sensor, corrections can be made to determine the position of the object notwithstanding the fact that external effects may have changed the conditions under which the measurements are being taken. For example, gaps between the magnetic members and the sensors can possibly change from one time to another or the ambient temperature surrounding the sensors and the magnetic members could have changed. By comparing the values of the two sensor readings, these variabilities can be factored out of the determination and the accurate position of the object can be measured.


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