The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 1993
Filed:
Dec. 20, 1991
Yutaka Hashimoto, Ayase, JP;
Mitsuhiko Iida, Yokohama, JP;
Makoto Hayashi, Zama, JP;
Sizunori Kaneko, Odawara, JP;
Masahiro Nakazato, Numazu, JP;
Toshiba Kikai Kabushiki Kaisha, Tokyo, JP;
Abstract
A print monitoring apparatus for monitoring a print transported out of a printing unit comprises a defect position discrimination unit for discriminating a position of a defect on a print web of the print fed from the printing unit, a defect memory unit for storing defect position information given from the defect position discrimination unit and record information containing defect occurrence time, a number of successive occurrence pages, a roll paper name and a number of used pages, and a display unit for displaying the information stored in the defect memory unit. In another aspect, a print monitoring apparatus for monitoring a print transported out of a printing unit comprises a print defect detection unit for detecting defect on a print web of the print fed from the printing unit, the defect detection unit including a monitoring sensor for dividing a print surface of the print web into a plurality of pixels and converting information of pixels into electric signals representing density information of the respective pixels, a central processing unit for processing information data regarding the density information of the respective pixels from the print defect detection unit, and a defect content discrimination unit for discriminating defect content in accordance with information data from the central processing unit and preliminarily set reference for the discrimination.