The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 1993
Filed:
Nov. 06, 1991
Paul E Kelley, San Jose, CA (US);
Teledyne MEC, Mountain View, CA (US);
Abstract
A method for performing mass analysis with dynamic mass resolution, in which a time-varying notch filtered broadband voltage signal (sometimes denoted as a time-varying 'filtered noise' signal) is applied to a quadrupole mass filter. The time-varying filtered noise signal can consist of a rapid sequence of static (time-invariant) filtered noise signals, each defining a notch having a selected width and center location. The invention facilitates performance of mass analysis over a wide range of ion mass-to-charge ratios ('mass ranges') with adequate mass resolution. By appropriately choosing the width of each notch in the applied time-varying filtered noise, mass analysis can be performed with substantially constant mass separation over a wide mass range. In order to maintain substantially constant mass separation while analyzing a selected consecutive or non-consecutive sequence of ions (by passing such sequence of ions through the mass filter), the applied filtered noise should have narrower notches at times when ions with higher mass-to-charge ratio are to be selected, and wider notches at times when ions with lower mass-to-charge ratio are to be selected.