The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 1993

Filed:

Apr. 26, 1991
Applicant:
Inventors:

Vincent C Conzola, Endwell, NY (US);

Norman E Rittenhouse, Endicott, NY (US);

Jeffrey M Solomon, Endicott, NY (US);

Thomas J Toomey, Denver, CO (US);

Peter J Yablonsky, Apalachin, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; F21V / ; F21V / ;
U.S. Cl.
CPC ...
356237 ; 25022729 ; 356446 ; 356340 ; 362 32 ; 362 33 ;
Abstract

The illumination system as a part of an optical inspection system, the total inspection system itself, and the method of illuminating and inspecting a workpiece. The illumination system is computer controlled as to a level of intensity and adjustable as to angle of incidence. The illumination system includes illumination control electronics, a quad quartz halogen lamp array light source, a fiber optic line converter and an illumination collection system, having a collimator lens array and a focusing/field coverage lens. As a result of the present invention, determinations of false defects on the PCB are minimized. Human contact with the PCB is also minimized and the rate of inspections performable is increased.


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