The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 1993

Filed:

Jan. 31, 1992
Applicant:
Inventors:

Jose A Lyon, Austin, TX (US);

Jules D Campbell, Jr, Austin, TX (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M / ;
U.S. Cl.
CPC ...
341120 ; 324 731 ;
Abstract

A method and apparatus for testing an analog to digital converter (14) having a resistor digital to analog converter (32). In one form, the analog to digital converter uses a small amount of resistor test logic (44) to test for defects in the resistor array (42), the switch array (38), and the optional decode logic (36). Instead of performing time-consuming analog to digital conversions, the functionality of the above mentioned circuitry, which includes some analog circuitry, is tested by using a pull-up function and a pull-down function that can be overdriven by properly functioning circuitry. As a result of using resistor test logic (44), a very quick pass/fail functional test using digital logic levels as inputs can be performed on the analog to digital converter (14). The quick functional test does not require analog inputs or time-consuming analog to digital conversions.


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