The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 1993
Filed:
Jul. 31, 1991
Donald B Mertens, Thousand Oaks, CA (US);
Louis E Gates, Jr, Westlake Village, CA (US);
Ronald I Wolfson, Los Angeles, CA (US);
William W Milroy, Playa del Rey, CA (US);
Joseph P Smalanskas, Westchester, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
A structure integrity monitoring apparatus and method for use with certain structures such as air-frame structures. A meandering transmission line (22) or serpentine coaxial cable is adhered to a dielectric substrate (20). The dielectric substrate may be a composite panel of the air-frame structure. A microwave signal is introduced at one end of the transmission line (22) or coaxial cable and absorbed at the other end by an appropriate signal absorbing device. For use of the meandering transmission line (22), generally two conductors (22, 24) are affixed on opposite sides of the dielectric substrate (20). In this manner, an electric field created by the two conductors (22, 24) by the microwave signals propagating through them is confined within the dielectric substrate (20). As the signals travel down the transmission conductors (22, 24), they will be reflected at crossover points along the way creating a signature reflection wave. If the dielectric substrate is flawed, a perturbation in the electric field caused by the flaw will create a reflection of the microwave signal at the flaw area. When this reflection signal is compared with the signature signal, it can be determined where and if a flaw is present.